Advanced Cargo Scanner Set for Tests at JFK International Airport

Trials of a new cargo scanner from Astrophysics, Inc are scheduled to begin in mid-2019 at New York JFK International Airport.

Astrophysics launched the Multi-View Computed Tomography (MVCT) system in February as the culmination of a six-year research and development program that included input from the Department of Homeland Security Science and Technology Directorate (DHS S&T).

MVCT combines the complementary techniques of multiview radiographic X-ray transmission and 3D CT (on a static gantry) to screen densely packed cargo in pallets without the need to individually take items out for security inspection.

Read more at Jane’s Airport 360

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